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Proceedings Paper

Analysis of crosstalk in front-illuminated InGaAs PIN hetero-junction photovoltaic infrared detector arrays
Author(s): Yongfu Li; Hengjing Tang; Kefeng Zhang; Tao Li; Jinhua Ning; Xue Li; Haimei Gong
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Paper Abstract

Here presented an experimental study on crosstalk in front illuminated planar and mesa-type InP/ InGaAs/ InP PIN hetero-junction photovoltaic infrared detector arrays. A scanning laser beam with an optical wavelength of 1310 nm coupled in a single-mode optical fiber placed within a few microns of the detector array surface was used to measure the crosstalk between the detector pixels. The crosstalk in the detector array varying with the distance between the incident laser spot and the measured pixel was shown. It is suggested that for the deep mesa-type arrays the dominating source of crosstalk is the light reflected from the detector substrate. And the dominating source of crosstalk that occurs in the planar type and shallow mesa type photovoltaic arrays is associated with photo-induced carries generated in the InGaAs absorption layer that diffuse laterally between neighbor pixels. These results gave out the possibility to optimize the detectors structures in order to reduce crosstalk.

Paper Details

Date Published: 5 August 2009
PDF: 6 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73831Z (5 August 2009); doi: 10.1117/12.835540
Show Author Affiliations
Yongfu Li, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Hengjing Tang, Shanghai Institute of Technical Physics (China)
Kefeng Zhang, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Tao Li, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Jinhua Ning, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Xue Li, Shanghai Institute of Technical Physics (China)
Haimei Gong, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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