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Proceedings Paper

Studies of RF magnetron sputtered amorphous HgCdTe films
Author(s): Jincheng Kong; Shanli Wang; Lingde Kong; Jun Zhao; Yu Ma; Guanghua Wang; Xiongjun Li; Lili Yang; Pengju Zhang; Rongbin Ji
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Paper Abstract

Amorphous HgCdTe (α-HgCdTe or α-MCT)films on glass substrate were deposited by RF magnetron sputtering technology, amorphous structure of MCT films were studied by XRD and AFM technology, and the "growth window" of α-MCT was obtained. FTIR technology was used to study the optics properties of amorphous MCT films, absorption coefficient of amorphous MCT films (~8×104cm-1) was obtained and we also observed three absorption regions near the optical gap of amorphous MCT, the optical gap of our a-MCT film is about 0.83eV. The transition of amorphous HgCdTe into crystal HgCdTe happened when the annealing temperature was higher than 130°C.

Paper Details

Date Published: 5 August 2009
PDF: 6 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73833Y (5 August 2009); doi: 10.1117/12.835539
Show Author Affiliations
Jincheng Kong, Kunming Institute of Physics (China)
Shanli Wang, Kunming Institute of Physics (China)
Lingde Kong, Kunming Institute of Physics (China)
Jun Zhao, Kunming Institute of Physics (China)
Yu Ma, Kunming Institute of Physics (China)
Guanghua Wang, Kunming Institute of Physics (China)
Xiongjun Li, Kunming Institute of Physics (China)
Lili Yang, Kunming Institute of Physics (China)
Pengju Zhang, Kunming Institute of Physics (China)
Rongbin Ji, Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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