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Proceedings Paper

Measuring method for refractive index of metal with terahertz time domain reflection spectroscopy
Author(s): Wenfeng Sun; Xinke Wang; Yan Zhang; Cunlin Zhang
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Paper Abstract

A method for measuring the refractive index of metal bulks in the terahertz region with terahertz time domain vertical reflection spectroscopy is proposed. In the experiment, the terahertz wave forms generated by laser induced air plasma and reflected by a silicon wafer and metal bulks are measured respectively. The Kramers-Kronig transformation is used to reduce the phase shift error that influences the accuracy on the experimental results. The refractive index of a silicon wafer, which was measured with terahertz time domain transmission spectroscopy, is used as a reference in the terahertz time domain reflection spectroscopy. Therefore the complex refractive index of metal has been obtained by the Fresnel law in the presence of the known silicon refractive index. By this method, the refractive indices of aluminum and copper plates in the terahertz region are measured, furthermore, these experimentally obtained results are discussed with the simple Drude model.

Paper Details

Date Published: 4 August 2009
PDF: 6 pages
Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851F (4 August 2009); doi: 10.1117/12.835535
Show Author Affiliations
Wenfeng Sun, Capital Normal Univ. (China)
Xinke Wang, Harbin Institute of Technology (China)
Yan Zhang, Capital Normal Univ. (China)
Cunlin Zhang, Capital Normal Univ. (China)


Published in SPIE Proceedings Vol. 7385:
International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications
X.-C. Zhang; James M. Ryan; Cun-lin Zhang; Chuan-xiang Tang, Editor(s)

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