Share Email Print
cover

Proceedings Paper

Sensitive measurement of optical nonlinearities of ZnSe based on a phase object
Author(s): Chang Wei Li; Yu Xiao Wang; Min Shui; Xiao Jin; Jun Yi Yang; Xue Ru Zhang; Kun Yang; Ying Lin Song
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A nonlinear image technique for characterization of the optical nonlinearities is used to investigate the solid semiconductor ZnSe at 600 nm. The method based on a 4f nonlinear image technique with a phase object is used to obtain the diffraction pattern of the nonlinear filter in solid ZnSe located at the Fourier plane by a CCD camera. The nonlinear absorption coefficient and nonlinear refraction index were both obtained by fitting the nonlinear image. Good agreement between the experiment data and the simulated result are obtained indicating a sensitive and powerful method for nonlinear optical measurements.

Paper Details

Date Published: 31 August 2009
PDF: 6 pages
Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73824A (31 August 2009); doi: 10.1117/12.835499
Show Author Affiliations
Chang Wei Li, Soochow Univ. (China)
Harbin Institute of Technology (China)
Yu Xiao Wang, Harbin Institute of Technology (China)
Min Shui, Soochow Univ. (China)
Harbin Institute of Technology (China)
Xiao Jin, Soochow Univ. (China)
Harbin Institute of Technology (China)
Jun Yi Yang, Soochow Univ. (China)
Harbin Institute of Technology (China)
Xue Ru Zhang, Harbin Institute of Technology (China)
Kun Yang, Harbin Institute of Technology (China)
Ying Lin Song, Soochow Univ. (China)


Published in SPIE Proceedings Vol. 7382:
International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging
Farzin Amzajerdian; Chun-qing Gao; Tian-yu Xie, Editor(s)

© SPIE. Terms of Use
Back to Top