Share Email Print
cover

Proceedings Paper

New methods for modal decomposition in multi-mode fibres
Author(s): S. Blin; T. N. Nguyen; D. M. Nguyen; P. Rochard; L. Provino; A. Monteville; T. Robin; A. Mugnier; B. Cadier; D. Pureur; M. Thual; T. Chartier
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We propose and demonstrate two methods for modal decomposition in multi-mode fibres. Linearly polarized modes propagating in a slightly multi-mode fibre are easily retrieved from intensity measurements at the fibre output surface. The first method is an improvement of the so-called spectrally and spatially imaging technique, which is limited to largemode- area optical fibers. The second method is a new, simpler and faster solution for the characterization of any kind of optical fibre, thus attractive in comparison to previously reported methods, which are cumbersome, time-consuming and/or limited to large-more-area fibres. Different kinds of multi-mode optical fibres are characterized. A large-modearea photonic-bandgap fibre, a photonic-crystal small-core non-linear fibre, and a standard index-stepped multi-mode fibre are characterized successfully.

Paper Details

Date Published: 5 October 2009
PDF: 4 pages
Proc. SPIE 7503, 20th International Conference on Optical Fibre Sensors, 750346 (5 October 2009); doi: 10.1117/12.835436
Show Author Affiliations
S. Blin, Lab. Foton, CNRS, Univ. de Rennes 1 (France)
T. N. Nguyen, Lab. Foton, CNRS, Univ. de Rennes 1 (France)
D. M. Nguyen, Lab. Foton, CNRS, Univ. de Rennes 1 (France)
P. Rochard, Lab. Foton, CNRS, Univ. de Rennes 1 (France)
L. Provino, Perfos (France)
A. Monteville, Perfos (France)
T. Robin, iXFiber (France)
A. Mugnier, Quantel, Etablissement R&D Lannion (France)
B. Cadier, iXFiber (France)
D. Pureur, Quantel, Etablissement R&D Lannion (France)
M. Thual, Lab. Foton, CNRS, Univ. de Rennes 1 (France)
T. Chartier, Lab. Foton, CNRS, Univ. de Rennes 1 (France)


Published in SPIE Proceedings Vol. 7503:
20th International Conference on Optical Fibre Sensors
Julian D. C. Jones, Editor(s)

© SPIE. Terms of Use
Back to Top