Share Email Print
cover

Proceedings Paper

Resolution capability of EBM-6000 and EBM-7000 for nano-imprint template
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Nano-Imprint Lithography (NIL) is one of the leading potential solutions for next generation lithography. Obtaining full field template with fine pattern resolution and reasonable throughput are the critical challenges in NIL. In a previous study, we reported the pattern resolution capability of EBM-6000 under nominal operation conditions (Current density: 70 A/cm2) that can be applied to CMOS device fabrication of 45 nm hp generation1. Smaller blur for better resolution is necessary to make NIL templates for 32nm hp generation and beyond. Blur in patterning process can be suppressed with smaller process blur, smaller aberration of electron optics, smaller forward scattering in resist and coulomb interaction among electrons. Beam blur incurred by coulomb interaction among electrons in EBM-6000 can be reduced with lower current density. In this paper, resolution extendibility of EBM-6000 with lower current density (30 A/cm2) was tested as one of the resolution enhancement techniques. Smaller aberration of electron optics is also effective to improve the resolution. We also checked the resolution of EBM-7000 under nominal operation conditions (Current density: 200 A/cm2) for a basic study of this paper. EBM-7000, which was developed for mask fabrication of 32 nm hp generation and mask development of 22 nm hp generation, will keep using 50 kV acceleration voltage and enhanced electron optics with smaller aberration as compared with EBM-60002.

Paper Details

Date Published: 27 May 2009
PDF: 7 pages
Proc. SPIE 7470, 25th European Mask and Lithography Conference, 74700H (27 May 2009); doi: 10.1117/12.835179
Show Author Affiliations
S. Yoshitake, NuFlare Technology, Inc. (Japan)
T. Kamikubo, NuFlare Technology, Inc. (Japan)


Published in SPIE Proceedings Vol. 7470:
25th European Mask and Lithography Conference
Uwe F. W. Behringer, Editor(s)

© SPIE. Terms of Use
Back to Top