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Proceedings Paper

Laser linewidth measurement based on image processing and non-air gap F-P etalon
Author(s): He-yong Zhang; Wei-jiang Zhao; De-ming Ren; Yan-chen Qu
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Paper Abstract

Laser linewidth measurement has been realized in the paper through image processing and on non-air gap F-P . Firstly , The expression of linewidth measurement founded on non-air gap F-P has been obtained from the interference theory of multi-beam of light. Secondly, The practical linewidth of pulse Nd:YAG laser has been measured with the method above. An interference pattern produced by CCD was used for digital image processing. In the course of processing, Canny operator was applied for the sake of picking-up the edge of interference circle, then the inner and external radius of the interference circle can be acquired in the form of pixels. The actual physical size can be calculated through relative transformation according to the radius of the interference circle. At last, Nd: YAG laser with 28ns pulsed-width was used as the emission source, The experimental results based on the method above is 36.8 MHz. This data is in agreement with 34.2 MHz through Discrete Fourier Transform(DFT), As we all know, the frequency resolving power of DFT is depend on the effective acquisition points, So the cubic spline interpolation was introduced after the course of DFT, and the better result has been achieved.

Paper Details

Date Published: 6 August 2009
PDF: 8 pages
Proc. SPIE 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, 73840Z (6 August 2009); doi: 10.1117/12.835109
Show Author Affiliations
He-yong Zhang, Harbin Institute of Technology (China)
Wei-jiang Zhao, Harbin Institute of Technology (China)
De-ming Ren, Harbin Institute of Technology (China)
Yan-chen Qu, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 7384:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications
Kun Zhang; Xiang-jun Wang; Guang-jun Zhang; Ke-cong Ai, Editor(s)

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