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Proceedings Paper

Optimization of the referential laser signal to a Fourier transform spectrometer
Author(s): Huandong Wei; Jianwen Hua; Zuoxiao Dai; Yafei Yuan; Zhanhu Wang; Dayu Li; Xinghui Duan; Xiaoqiang Jin
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Paper Abstract

The vertical atmospheric sounding interferometer is based on the classical Michelson Interferometer mechanics. To keep the uniformity of the speed and the alignment of the movable plane mirror, it introduces the referential optical path. As the metrological standard, it is very important to get high-quality referential signals. Because of the complexity of the interference system, the referential signals will degenerate when arriving at the laser detectors. In this paper, three factors that impact the quality of the referential signals and countermeasures are presented. Firstly because the laser speckle is not ideally proportioned and the laser beam is not ideally vertically reflected by the movable mirror, the laser speckle swings with the movement of the movable mirror, resulting in the fluctuating of the power radiated on the laser detectors. Secondly, when the initial angle between the fixed mirror and the movable mirror is too large, the modulation depth ripples in a large scale with the small misalignment of the movable mirror. Lastly, the light reflected back to the semiconductor laser will engender impact on the light source. By taking countermeasures, usable, accurate enough referential laser signals are finally acquired.

Paper Details

Date Published: 28 August 2009
PDF: 8 pages
Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73820W (28 August 2009); doi: 10.1117/12.835069
Show Author Affiliations
Huandong Wei, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Jianwen Hua, Shanghai Institute of Techncial Physics (China)
Zuoxiao Dai, Shanghai Institute of Techncial Physics (China)
Yafei Yuan, Shanghai Institute of Techncial Physics (China)
Zhanhu Wang, Shanghai Institute of Techncial Physics (China)
Dayu Li, Shanghai Institute of Techncial Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Xinghui Duan, Shanghai Institute of Techncial Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Xiaoqiang Jin, Shanghai Institute of Techncial Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 7382:
International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging
Farzin Amzajerdian; Chun-qing Gao; Tian-yu Xie, Editor(s)

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