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Proceedings Paper

An infrared imaging computation model and its validation
Author(s): Hongning Li; TingZhu Bai; Shuai Ma; Xiaoyu Lv; Peng Gao; Weiping Yang; Jie Feng
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Paper Abstract

The infrared imaging equipment is widely used because it can acquire more thermal and material information from infrared band than from visible band. Based on the lighting model which is widely used in computer graphics and the radiation transfer law, a simplified thermal infrared imaging computation model is derived. The following works have been done to derive the model: 1) Adding the surface temperature distribution of the 3D model; 2) Specifying the physical material of the 3D geometry model; 3) Merging the self emitting and the detector response into the imaging model as one term. The ray tracing method is applied to construct an infrared imaging simulation system which can generate the synthetic infrared images of a 3D scene from any angle of view. To validate the infrared imaging computation model, several typical 3D scenes are made, and their infrared images are calculated to compare and contrast with the measured infrared images obtained by a middle infrared band imaging camera. The result shows that: 1) The infrared imaging computation model is capable of producing infrared images which is very similar to those received by thermal infrared camera; 2) The infrared imaging computation model can well simulate the relative brightness contrast in the infrared images, it also can reflect most of the basic infrared imaging characteristics; 3) Some geometry, thermal and material information also can be retrieved from the synthetic infrared images. Quantitative analysis shows that the absolute brightness does not match well, and the reasons are analyzed. By the synthetic infrared images, it also illustrates the difficulty and complexity in infrared image analysis and simulation.

Paper Details

Date Published: 4 August 2009
PDF: 6 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73833A (4 August 2009); doi: 10.1117/12.835063
Show Author Affiliations
Hongning Li, Beijing Institute of Technology (China)
Yunnan Normal Univ. (China)
TingZhu Bai, Beijing Institute of Technology (China)
Shuai Ma, Beijing Institute of Technology (China)
Xiaoyu Lv, Beijing Institute of Technology (China)
Peng Gao, Beijing Institute of Technology (China)
Weiping Yang, Yunnan Normal Univ. (China)
Jie Feng, Yunnan Normal Univ. (China)


Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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