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Proceedings Paper

Applied research of the maximum classification square error method using linear CCD
Author(s): Chunting Ma; Ning Liu; Chao Xiong; Liqing Fang
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Paper Abstract

The method of average threshold and the Maximum Classification Square Error Method are the important statistics methods in the data signal process. The result of calculation are compared. The constitution of the linear CCD measuring system are induced. The compare experiment using the instrument whose precision less than 0.1 are detected. On the condition of outside light interfere, the result of experiment is satisfied to the expectation of the measuring.

Paper Details

Date Published: 6 August 2009
PDF: 6 pages
Proc. SPIE 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, 73840U (6 August 2009); doi: 10.1117/12.834988
Show Author Affiliations
Chunting Ma, Shijiazhuang Mechanical Engineering College (China)
Ning Liu, Hebei Univ. of Science and Technology (China)
Chao Xiong, Shijiazhuang Mechanical Engineering College (China)
Liqing Fang, Shijiazhuang Mechanical Engineering College (China)


Published in SPIE Proceedings Vol. 7384:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications
Kun Zhang; Xiang-jun Wang; Guang-jun Zhang; Ke-cong Ai, Editor(s)

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