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Proceedings Paper

Analysis of imaging quality under the systematic parameters for thermal imaging system
Author(s): Bin Liu; Weiqi Jin
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Paper Abstract

The integration of thermal imaging system and radar system could increase the range of target identification as well as strengthen the accuracy and reliability of detection, which is a state-of-the-art and mainstream integrated system to search any invasive target and guard homeland security. When it works, there is, however, one defect existing of what the thermal imaging system would produce affected images which could cause serious consequences when searching and detecting. In this paper, we study and reveal the reason why and how the affected images would occur utilizing the principle of lightwave before establishing mathematical imaging model which could meet the course of ray transmitting. In the further analysis, we give special attentions to the systematic parameters of the model, and analyse in detail all parameters which could possibly affect the imaging process and the function how it does respectively. With comprehensive research, we obtain detailed information about the regulation of diffractive phenomena shaped by these parameters. Analytical results have been convinced through the comparison between experimental images and MATLAB simulated images, while simulated images based on the parameters we revised to judge our expectation have good comparability with images acquired in reality.

Paper Details

Date Published: 5 August 2009
PDF: 9 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73832V (5 August 2009); doi: 10.1117/12.834726
Show Author Affiliations
Bin Liu, Beijing Institute of Technology (China)
Weiqi Jin, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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