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Proceedings Paper

The optical scanning technology in laser scanning and tracking system
Author(s): Shu-ying Li; Shi-chun Zhou
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Paper Abstract

Laser scanning and tracking technology has been widely used in many applications. For a laser scanning and tracking system, a two-dimensional scanning mirror is usually combined with a plane array detector to detect and track the object. The scanning process and quality of acquired images from the detector are two key factors and they are both correlated with the choice of scanning mode, which is a known hard problem and little has been done in the subject. Based on this deficiency, this paper analyzes and compares two common two-dimensional scan mode-continuous scan and step scan, from a theoretical point of view. As we known, the continuous scan can acquire data quickly and is easy to implement. But the acquired images may blur severely due to the fast continuous scan velocity. The step scan can produce highquality images, but it takes much longer time and is more difficult to control. Formulas are proposed in this paper to quantitatively measure the characteristics of each mode and evaluate the parameters that affect the scanning process. These results can be provided as a reference for the proper choice of scanning mode. Moreover, through analysis of imaging characteristics of the detector, an improved raster scan pattern is presented to reduce the number of dead zones and enhance the performance of the system.

Paper Details

Date Published: 4 August 2009
PDF: 7 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73832B (4 August 2009); doi: 10.1117/12.834554
Show Author Affiliations
Shu-ying Li, Shanghai Institute of Technical Physics (China)
Shi-chun Zhou, Shanghai Institute of Technical Physics (China)

Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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