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Proceedings Paper

The Debye characteristic temperature of nanodiamond thin films
Author(s): Yongjie Wang; Qingxun Zhao; Zhanlong Zhao; Zengqian Yin; Qian Yang; Han Li
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Paper Abstract

The Debye characteristic temperature is a useful parameter of nanodiamond thin films. In this paper, the Debye characteristic temperature of diamond thin films is studied through X-ray diffraction intensity at a fixed temperature. From x-ray diffraction, we can get the average crystallite size of diamond thin film. By the method of Xueshan Lu and Jingkui Liang, the Debye-Waller factor and Debye temperature are calculated, they are B=0.010937 nm2 and ΘD=527.95K, the Debye temperature is about one-fourth of the Debye characteristic temperature of the bulk diamond single crystal (about 2200K). The relationship between crystal size and Debye characteristic temperature is also discussed. The Debye characteristic temperature depends on particle size. When the diamond changes from bulk diamond to diamond films, the crystal size of diamond becomes smaller, so the Debye characteristic temperature becomes lower. This means that the atom binding force becomes weak, and it can increase the activity of nanodiamond thin films.

Paper Details

Date Published: 24 August 2009
PDF: 5 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73810R (24 August 2009); doi: 10.1117/12.834548
Show Author Affiliations
Yongjie Wang, North China Electric Power Univ. (China)
Qingxun Zhao, Hebei Univ. (China)
Zhanlong Zhao, North China Electric Power Univ. (China)
Zengqian Yin, North China Electric Power Univ. (China)
Qian Yang, North China Electric Power Univ. (China)
Han Li, North China Electric Power Univ. (China)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

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