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Proceedings Paper

System identification of tracking error and evaluation of tracking performance using BP neural network
Author(s): Ning Zhang; Xiang-heng Shen
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Paper Abstract

A novel approach for evaluating the tracking performance of optoelectronic theodolite is proposed. First, an equivalent mathematic model of tracking error is established. Then, the equivalent sine signal is inputted to the equivalent model, and the outputs are sampled. The results of evaluating the tracking performance are obtained based on the statistical calculation of output produced by equivalent model. Equivalent model using the BP (Backprogration) neural network structure is identified. The training method of BP neural network adopts the LM (Levenberg-Marquardt) algorithm for the sake of speeding up training process. The BP neural network is trained and tested by using the training and testing samples gotten from the simulation model of optoelectronic theodolite tracking system under MATLAB/SIMULINK. The estimate errors of equivalent model including average error, maximum error and standard error are 2.5872e-006°≈0°, 2.8" and 1.9". The results show that the equivalent model identified based on BP neural network meets the needs of evaluating the tracking performance of optoelectronic theodolite. The accurate evaluation of tracking performance is achieved.

Paper Details

Date Published: 5 August 2009
PDF: 9 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73832F (5 August 2009); doi: 10.1117/12.834237
Show Author Affiliations
Ning Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Xiang-heng Shen, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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