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Proceedings Paper

New method of annular sub-apertures stitching
Author(s): Yun Su; Kai Wang; Ningjuan Ruan; Bo Li
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Paper Abstract

Annular sub-apertures stitching technology is a feasible method for testing asphere without assistant equipment. The overlap area of two annular sub-apertures is needed to sample in traditional stitching way. The size of overlap area influences the accuracy and efficiency of annular sub-apertures stitching, since small area will deduce the error of calculation, otherwise, more sub-apertures will be needed. Based on the principle of annular sub-apertures interference, a model is built to calculate the parameters of sub-apertures according to equal thickness interference in this paper firstly; then two clear-cut interference areas near the center of asphere and annular sub-apertures are figured out by theory and simulation. A new method is presented to use interference area near the center of asphere as the overlap area to sample. The results of simulation in the paper reveal that this new method can reduce stitching error relatively and improve efficiency availably, solving the inconsistency of error and efficiency consequently.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830I (20 May 2009); doi: 10.1117/12.834194
Show Author Affiliations
Yun Su, Beijing Institute of Space Mechanics & Electricity (China)
Kai Wang, Beijing Institute of Space Mechanics & Electricity (China)
Ningjuan Ruan, Beijing Institute of Space Mechanics & Electricity (China)
Bo Li, Beijing Institute of Space Mechanics & Electricity (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

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