Share Email Print
cover

Proceedings Paper

Electrical and optical properties of Mn1.56Co0.96Ni0.48O4 films for infrared detection
Author(s): Jing Wu; Zhi Ming Huang; Yuan Hou; Yan Qing Gao; Jun Hao Chu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Mn1.56Co0.96Ni0.48O4 films with spinel structure for infrared detection are prepared on Al2O3 substrate by chemical solution deposition method. The resistance vs temperature (R-T) characteristics at 130~304 K temperature range and infrared transmission spectrum (1-10 μm) are measured and temperature coefficients of resistance (TCR) are calculated. The conduction process can be explained well by hopping conduction. At low temperature nearest neighbor hopping (NNH) mechanism fits the data well, while at high temperature, variable range hopping (VRH) mechanism dominates the system, and this transition temperature is at about 200 K. The value of TCR is about -3.73% K-1 at 300 K. Mn1.56Co0.96Ni0.48O4 films exhibit a strong absorption around 2μm which is considered to be corresponding to the gap of energy bands showed by infrared transmission spectrum. The band gap obtained from the transmission spectrum data using the Tauc's law is ~0.567 eV.

Paper Details

Date Published: 24 August 2009
PDF: 8 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 738115 (24 August 2009); doi: 10.1117/12.833507
Show Author Affiliations
Jing Wu, Shanghai Institute of Technical Physics (China)
Zhi Ming Huang, Shanghai Institute of Technical Physics (China)
Yuan Hou, Shanghai Institute of Technical Physics (China)
Yan Qing Gao, Shanghai Institute of Technical Physics (China)
Jun Hao Chu, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

© SPIE. Terms of Use
Back to Top