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Proceedings Paper

Numerical calculation and simulation analysis of electrical field characteristics for the electrical resistance tomography system
Author(s): Yanjun Zhang; Deyun Chen; Lili Wang
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Paper Abstract

Sensitivity field in electrical resistance tomography system is affected by the distribution of multiphase medium, and the data of sensitivity distribution which are obtained by theoretical calculation can be used as prior experimental knowledge for image reconstruction, so it is necessary to analyze the distribution of the sensitivity field to decrease error of soft field and improve the quality of the image reconstruction. In this paper at the basis of analyzing the principle of electrical resistance tomography system, the mathematical model of sensitivity field is built by utilizing finite element method. Through study field with disperse phase, the factors affecting the distribution of the sensitivity field and rules are analyzed, the calculation of sensitivity distribution and visualized simulation are achieved The experiments show that the finite element model is right, the sensitivity field proposed is in accordance with the practice and the computation velocity is about 10seconds, which provides the basis for related image reconstruction algorithms.

Paper Details

Date Published: 24 August 2009
PDF: 10 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 738119 (24 August 2009); doi: 10.1117/12.833444
Show Author Affiliations
Yanjun Zhang, Harbin Univ. of Science and Technology (China)
Deyun Chen, Harbin Univ. of Science and Technology (China)
Lili Wang, Harbin Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

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