Share Email Print
cover

Proceedings Paper

Feature extraction and waveform analysis of the optoelectronic liquid drop fingerprint
Author(s): Qing Song; Jing Liu; Di Wu; Jiayong Huang; Chunsong Zhang
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The optoelectronic liquid drop fingerprint (OLDF) can be constructed by merging the fiber signal and the capacitive signal, which shows a very fruitful source of information on the bulk properties of the tested liquids, and it is unique and definite for a certain liquid under certain conditions. Therefore OLDF is favorable for fine discrimination among different liquids. There are some visible differences for different liquids in the same experimental system, such as the output fiber voltage (or the light intensity), the output capacitor voltage (or the drop volume), the peak height and the profile of fingerprint, and the curve area surrounded by the fingerprint and the axis. So waveform analysis method and calculated parameters characterizing waveform are employed for feature extraction to identify different liquids. In this paper, the conception of waveform parameters and software algorithm are described in detail, and the resolution of the parameters is analyzed and compared base on experimental data of samples.

Paper Details

Date Published: 30 October 2009
PDF: 7 pages
Proc. SPIE 7495, MIPPR 2009: Automatic Target Recognition and Image Analysis, 74952Q (30 October 2009); doi: 10.1117/12.833058
Show Author Affiliations
Qing Song, Beijing Univ. of Posts and Telecommunications (China)
Jing Liu, Beijing Univ. of Posts and Telecommunications (China)
Di Wu, Beijing Univ. of Posts and Telecommunications (China)
Jiayong Huang, Beijing Univ. of Posts and Telecommunications (China)
Chunsong Zhang, Beijing Univ. of Posts and Telecommunications (China)


Published in SPIE Proceedings Vol. 7495:
MIPPR 2009: Automatic Target Recognition and Image Analysis
Tianxu Zhang; Bruce Hirsch; Zhiguo Cao; Hanqing Lu, Editor(s)

© SPIE. Terms of Use
Back to Top