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Proceedings Paper

Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications
Author(s): Keith Ruxton; Arup Lal Chakraborty; Andrew J. McGettrick; Kevin Duffin; Walter Johnstone; George Stewart
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Paper Abstract

A limiting factor of tuneable diode laser spectroscopy (TDLS) with wavelength modulation spectroscopy (WMS) is the presence of background residual amplitude modulation (RAM) on the recovered 1st harmonic signal. The presence of this background term is due to direct modulation of the source laser power. This work presents a novel method to optically remove the unwanted background, with the major benefit being that measurement sensitivity can be increased. The recently developed phasor decomposition method1 (PDM), is a near IR (NIR) TDLS analysis technique that is used with the addition of the new RAM nulling method to recover gas absorption line-shapes. The PDM is a calibration free approach, which recovers the gas absorption line-shape and the isolated 1st derivative of the line-shape from the 1st harmonic signal. The work presented illustrates and validates the new RAM nulling procedure with measurements examining the 1650.96nm absorption line of methane (CH4) with comparisons to theory.

Paper Details

Date Published: 5 October 2009
PDF: 4 pages
Proc. SPIE 7503, 20th International Conference on Optical Fibre Sensors, 750313 (5 October 2009); doi: 10.1117/12.833000
Show Author Affiliations
Keith Ruxton, Univ. of Strathclyde (United Kingdom)
Arup Lal Chakraborty, Univ. of Strathclyde (United Kingdom)
Andrew J. McGettrick, Univ. of Strathclyde (United Kingdom)
Kevin Duffin, Univ. of Strathclyde (United Kingdom)
Walter Johnstone, Univ. of Strathclyde (United Kingdom)
George Stewart, Univ. of Strathclyde (United Kingdom)


Published in SPIE Proceedings Vol. 7503:
20th International Conference on Optical Fibre Sensors
Julian D. C. Jones, Editor(s)

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