Share Email Print
cover

Proceedings Paper

Structural edge detection using wavelet domain statistical model
Author(s): Shubin Zhao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Edges play an important role in most computer vision and image analysis systems, and extracting structural edges is the main goal of edge detection for many applications. But due to the presence of noise and texture, structural edge detection is not a trivial work. In this paper, an approach is presented for structural edge detection, which is formulated as a statistical pattern recognition problem in wavelet transform domain. In the approach, both inter-scale and intra-scale dependences among wavelet coefficients are utilized, where the former dependences are encoded by inter-scale coefficient ratios and the latter by anisotropic MRF model. To reduce the computational complexity, independent mixture of Gaussian is used to model wavelet coefficients, which corresponds to Rayleigh distribution for gradient magnitude, and posterior probabilities are computed to measure the edge strengths. Inter- and intra-scale dependences among coefficients are utilized to suppress noise and texture, and these measures can significantly improve edge continuity in scale space. To show the effectiveness of the presented algorithm, experiments are conducted on various kinds of real-world images, and several results are given for assessment.

Paper Details

Date Published: 30 October 2009
PDF: 8 pages
Proc. SPIE 7495, MIPPR 2009: Automatic Target Recognition and Image Analysis, 74954H (30 October 2009); doi: 10.1117/12.832989
Show Author Affiliations
Shubin Zhao, Jiangsu Automation Research Institute (China)


Published in SPIE Proceedings Vol. 7495:
MIPPR 2009: Automatic Target Recognition and Image Analysis
Tianxu Zhang; Bruce Hirsch; Zhiguo Cao; Hanqing Lu, Editor(s)

© SPIE. Terms of Use
Back to Top