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Proceedings Paper

A novel method for evaluating the validity of the visual attended regions based on SIFT descriptors
Author(s): Jie Xiao; Mingyue Ding; Chao Cai; Chengping Zhou
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Paper Abstract

Selective visual attention can direct our gaze rapidly towards objects of interest in the view. Better coverage of target region for attention can better serve for recognition. A novel method for evaluating how well the attended regions contribute to the recognition of the target based on SIFT descriptors is proposed in this paper. The method is used to evaluate the attended regions extracted by some visual attention mechanisms on real remote sensor images with different geometric and photometric transformations and for different scene types. The evaluation method proposed in this paper give an explicit, accurate and robust expression about the attended region in visual attention mechanisms and we believe this method could be applicable in visual attention mechanisms in the future work.

Paper Details

Date Published: 30 October 2009
PDF: 7 pages
Proc. SPIE 7496, MIPPR 2009: Pattern Recognition and Computer Vision, 749604 (30 October 2009); doi: 10.1117/12.832638
Show Author Affiliations
Jie Xiao, Huazhong Univ. of Science and Technology (China)
Mingyue Ding, Huazhong Univ. of Science and Technology (China)
Chao Cai, Huazhong Univ. of Science and Technology (China)
Chengping Zhou, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7496:
MIPPR 2009: Pattern Recognition and Computer Vision
Mingyue Ding; Bir Bhanu; Friedrich M. Wahl; Jonathan Roberts, Editor(s)

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