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Proceedings Paper

A new multilayer model for the investigation of lunar regolith depth
Author(s): Mingxing Zhou; Jianjiang Zhou; Fei Wang; Xiao Zhang
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Paper Abstract

Passive microwave remote sensing was firstly applied to detect the moon by Chang'E-1 satellite with a four channel microwave radiometer. Its primary goal is to detect the thickness of lunar regolith and to assess the content of 3He. There are remained theoretical problems to be systematically solved, which include to research the microwave radiation transfer properties and to establish the suitable model to inverse lunar regolith depth. Considering the variation of these factors influencing on the brightness temperature, a new multi-layer microwave transfer model to inverse the depth of lunar regolith is presented. The physical factors among top lunar regolith influencing the brightness temperature change sharply with the thickness, so the top lunar regolith is divided subtly. On the contrary, the deep lunar regolith where the factors vary slowly with the thickness is divided roughly. Then, by applying the fluctuation dissipation theorem, the brightness temperatures obtained from four frequency channels (3.0GHz, 7.8GHz, 19.35GHz, 37GHz) are simulated based on the multi-layer model at different locations on the moon and at different times of a lunar day. In comparison the calculated results with other models, it indicates that the proposed model has better stability and less calculation.

Paper Details

Date Published: 30 October 2009
PDF: 8 pages
Proc. SPIE 7498, MIPPR 2009: Remote Sensing and GIS Data Processing and Other Applications, 74980B (30 October 2009); doi: 10.1117/12.832283
Show Author Affiliations
Mingxing Zhou, Nanjing Univ. of Aeronautics and Astronautics (China)
Jianjiang Zhou, Nanjing Univ. of Aeronautics and Astronautics (China)
Fei Wang, Nanjing Univ. of Aeronautics and Astronautics (China)
Xiao Zhang, Nanjing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 7498:
MIPPR 2009: Remote Sensing and GIS Data Processing and Other Applications
Faxiong Zhang; Faxiong Zhang, Editor(s)

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