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Proceedings Paper

Characterizations of displaying magnetic-fluid microelectromechanical light modulator with laser speckle technique
Author(s): Xijun Wang; Desheng Li; Yajun Wang; Shaochang Su; Jook Wooh Seo
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Paper Abstract

The change of the thickness of magnetic fluid which modulates light intensity is the display principle of magnetic-fluid microelectromechanical light modulator which has two display states - light state and dark state. As a kind of non-contacting, non-destructive, and real-time testing method, laser speckle technique can be used to character the display process of magnetic-fluid microelectromechanical light modulator. In this paper, during displaying the magnetic-fluid microelectromechanical light modulator, a collimated laser beam is illuminated on it. Meanwhile, a charge-couple device (CCD) camera capable of 480*640 square pixels is used to real-timely record speckle patterns which can be used to character the state of the magnetic-fluid microelectromechanical light modulator, and the time interval of adjacent speckle patterns is 20 ms which is chosen depending on the transition speed the device changes from a dark state to a light state. 160 frames adjacent speckle patterns are chosen to be analyzed. The 80th, 160th, 320th (the middle columns), 480th, and the 640th columns are taken out separately from the chosen speckle patterns to obtain five THSP (Time History speckle pattern) images 480*160 pixels. Based on these five THSP images, the relationship between the change of light intensity and the change of time is got. Change of light intensity with time shows that: the change of light intensity of speckle patterns has a good agreement with the display state of magnetic-fluid microelectromechanical light modulator. laser speckle pattern technique is an efficient way to be applied to real-time test and character modulator. In one word, as for microelectromechanical system (MEMS) test, the laser speckle pattern technique will be a non-contact, real-time, and non-destructive optical method which have a rapid developing speed and a wide application in the future.

Paper Details

Date Published: 18 May 2009
PDF: 4 pages
Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 728402 (18 May 2009); doi: 10.1117/12.832060
Show Author Affiliations
Xijun Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Desheng Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of CAS (China)
Yajun Wang, Xi-an Institute of optics and Fine Mechanics (China)
Shaochang Su, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of CAS (China)
Jook Wooh Seo, Hongik Univ. (China)


Published in SPIE Proceedings Vol. 7284:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Sen Han; Masaomi Kameyama; Xiangang Luo, Editor(s)

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