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Proceedings Paper

Optically sectioned imaging by oblique plane microscopy
Author(s): C. Dunsby
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Paper Abstract

An optically sectioning microscopy technique based on oblique selective plane illumination combined with oblique imaging is described. The same high numerical aperture lens is used to both illuminate and image the specimen and correction optics are employed to tilt the focal plane of the imaging system so that the imaged plane aligns with the illuminated plane in the specimen. An optically sectioned image is obtained without the use of moving parts or image processing and this technique therefore has the potential to be used for very high speed optically sectioned microscopy. As only the part of the specimen that is being imaged is illuminated then the photobleaching and phototoxicity of this method is low compared to conventional microscopy techniques.

Paper Details

Date Published: 1 July 2009
PDF: 4 pages
Proc. SPIE 7367, Advanced Microscopy Techniques, 73670H (1 July 2009); doi: 10.1117/12.831543
Show Author Affiliations
C. Dunsby, Imperial College London (United Kingdom)

Published in SPIE Proceedings Vol. 7367:
Advanced Microscopy Techniques
Paul J. Campagnola; Ernst H. K. Stelzer; Gert von Bally, Editor(s)

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