Share Email Print
cover

Proceedings Paper

Super-resolved position and orientation of fluorescent dipoles
Author(s): François Aguet; Stefan Geissbühler; Iwan Märki; Theo Lasser; Michael Unser
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We introduce an efficient, image formation model-based algorithm that extends super-resolution fluorescence localization to include orientation estimation, and report experimental accuracies of 5 nanometers for position estimation and 2 degrees for dipole orientation estimation.

Paper Details

Date Published: 1 July 2009
PDF: 4 pages
Proc. SPIE 7367, Advanced Microscopy Techniques, 73670Y (1 July 2009); doi: 10.1117/12.831488
Show Author Affiliations
François Aguet, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Stefan Geissbühler, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Iwan Märki, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Theo Lasser, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Michael Unser, Ecole Polytechnique Fédérale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 7367:
Advanced Microscopy Techniques
Paul J. Campagnola; Ernst H. K. Stelzer; Gert von Bally, Editor(s)

© SPIE. Terms of Use
Back to Top