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Proceedings Paper

Optimum design for maximum wavelength resolution based on the edge filter ratiometric system
Author(s): Qiang Wu; Ginu Rajan; Pengfei Wang; Yuliya Semenova; Gerald Farrell
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Paper Abstract

This paper provides an analysis of the influence of a range of factors on the resolution of the ratiometric wavelength measurement system including the slope of the edge filter, the spectral nature of the input optical signal and the working wavelength range. Our investigations show that, for a given input optical signal and when the working wavelength range is known, it is relatively straightforward to select an optimum slope for the edge filter that will yield a maximum resolution for the system.

Paper Details

Date Published: 24 August 2009
PDF: 6 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73810H (24 August 2009); doi: 10.1117/12.831418
Show Author Affiliations
Qiang Wu, Dublin Institute of Technology (Ireland)
Ginu Rajan, Dublin Institute of Technology (Ireland)
Pengfei Wang, Dublin Institute of Technology (Ireland)
Yuliya Semenova, Dublin Institute of Technology (Ireland)
Gerald Farrell, Dublin Institute of Technology (Ireland)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

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