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Proceedings Paper

URMS/AMSSP (Universal Radiation Measurement System/Airborne Multi-Spectral Sunphoto- and Polarimeter)
Author(s): Thomas Ruhtz; René Preusker; Andre Hollstein; Jonas v. Bismarck; Marco Starace; Jürgen Fischer
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Paper Abstract

URMS was proposed within the framework of a German priority program (PP 1294, Atmosphären- und Erdsystemforschung mit dem Forschungsflugzeug HALO (High Altitude and Long Range Research Aircraft)). The project proposal resulted of the facts that experimental setups with state-of-the-art measurement principles and multidirectional geometries in the field of scientific aircraft radiation measurements are very difficult or not possible to achieve with the existing aircrafts and their openings and mounting points. Thus it is very difficult to develop and enhance remote sensing instruments and the corresponding new models and algorithms to analyze the resulting data. URMS will give the possibility to perform multi directional measurements with experimental instrument setups. An optical entrance head with a dual mirror system simular to a coleostat in front of a Wing-Pod will guide the light scattered from surfaces and/or the atmosphere into a Wing-Pod frame. A temperatur stabilized container will hold the optical instrument inside a stable environment. An Airborne Multispectral Sunphoto- and Polarimeter was proposed as a first state-of-the-art instrument setup.

Paper Details

Date Published: 24 September 2009
PDF: 8 pages
Proc. SPIE 7475, Remote Sensing of Clouds and the Atmosphere XIV, 74750T (24 September 2009); doi: 10.1117/12.831209
Show Author Affiliations
Thomas Ruhtz, Free Univ. Berlin (Germany)
René Preusker, Free Univ. Berlin (Germany)
Andre Hollstein, Free Univ. Berlin (Germany)
Jonas v. Bismarck, Free Univ. Berlin (Germany)
Marco Starace, Free Univ. Berlin (Germany)
Jürgen Fischer, Free Univ. Berlin (Germany)

Published in SPIE Proceedings Vol. 7475:
Remote Sensing of Clouds and the Atmosphere XIV
Richard H. Picard; Klaus Schäfer; Adolfo Comeron; Evgueni I. Kassianov; Christopher J. Mertens, Editor(s)

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