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Proceedings Paper

Influence of hole transporter doping on electroluminescent property of novel fluorene molecular material
Author(s): Jincheng Qian; Junsheng Yu; Shuangling Lou; Yadong Jiang; Qing Zhang
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Paper Abstract

The luminescent characteristics of a novel small molecule fluorene material, 6,6'-(9H-fluoren-9,9-diyl)bis(2,3-bis(9,9-dihexyl-9H-fluoren-2-yl)quinoxaline) (BFLBBFLYQ) for organic light-emitting diode are systemically investigated, especially focusing on the effect of hole transporter doping concentration. Double-layer devices with a structure of indium tin oxide (ITO)/emissive layer (EML)/2,9-dimethyl-4,7-diphenyl-l,10-phenanthroline (BCP)/Mg:Ag are fabricated by spin-coating method, where EML is BFLBBFLYQ and blend of BFLBBFLYQ: N,N'-biphenyl-N,N'-bis-(3-methylphenyl)-1,1'-biphenyl-4,4'-diamine (TPD), respectively. The results show that the performance of the device is improved two magnitudes by doping BFLBBFLYQ with TPD. In the electroluminescent (EL) spectra, the BFLBBFLYQ device show a blue light emission peaking at 485 nm, and the blend device exhibits a broad banded emission with 45 nm red-shifted peaking at 530 nm in green light area. The photoluminescent (PL) spectra of BFLBBFLYQ, TPD and BFLBBFLYQ: TPD blend in xylene solution and spin-coated film is also studied, yielding an evidence that exciplex maybe plays the role for low energy emission.

Paper Details

Date Published: 21 May 2009
PDF: 5 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72823F (21 May 2009); doi: 10.1117/12.831036
Show Author Affiliations
Jincheng Qian, Univ. of Electronic Science and Technology of China (China)
Junsheng Yu, Univ. of Electronic Science and Technology of China (China)
Shuangling Lou, Univ. of Electronic Science and Technology of China (China)
Yadong Jiang, Univ. of Electronic Science and Technology of China (China)
Qing Zhang, Shanghai Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; John M. Schoen; Yoshiharu Namba; Shengyi Li, Editor(s)

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