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Proceedings Paper

Characterization of vapor-deposited Lu[sub]2[/sub]O[sub]3[/sub]:Eu[sup]3+[/sup] scintillator for x-ray imaging applications
Author(s): Vivek V. Nagarkar; S. G. Topping; S. R. Miller; B. Singh; C. Brecher; V. K. Sarin
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Paper Abstract

The europium-doped lutetium oxide (Lu2O3:Eu) transparent optical ceramic has excellent scintillation properties, namely very high density (9.5 g/cm3), high effective atomic number (67.3), light output comparable to thallium-doped cesium iodide (CsI:Tl), and emission wavelength (610 nm) for which silicon-based detectors have a very high quantum efficiency. If microcolumnar films of this material could be fabricated, it would find widespread use in a multitude of highspeed imaging applications. However, the high melting point of over 2400°C makes it extremely challenging to make microcolumnar films of this material. We have recently fabricated and characterized microcolumnar films of Lu2O3:Eu. These results are presented in this paper.

Paper Details

Date Published: 11 September 2009
PDF: 7 pages
Proc. SPIE 7450, Penetrating Radiation Systems and Applications X, 745003 (11 September 2009); doi: 10.1117/12.831031
Show Author Affiliations
Vivek V. Nagarkar, Radiation Monitoring Devices, Inc. (United States)
S. G. Topping, Boston Univ. (United States)
S. R. Miller, Radiation Monitoring Devices, Inc. (United States)
B. Singh, Radiation Monitoring Devices, Inc. (United States)
C. Brecher, ALEM Associates (United States)
V. K. Sarin, Boston Univ. (United States)

Published in SPIE Proceedings Vol. 7450:
Penetrating Radiation Systems and Applications X
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Richard C. Schirato, Editor(s)

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