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Proceedings Paper

Preparation and characterization of polyaniline/indium(III) oxide (PANi/In2O3) nanocomposite thin film
Author(s): Xiaolei Yan; Guangzhong Xie; Xiaosong Du; Huiling Tai; Yadong Jiang
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Paper Abstract

In the last few decades, conductive polymers such as polyaniline, polypyrrole, and polythiophene have been widely investigated as effective sensitive materials for chemical gas sensors. Among them, polyaniline (PANI) is frequently used because of its ease and cheap of synthesis, environmental stability and intrinsic redox reaction. However, problems with these conductive polymers include their low processing ability, poor mechanical strength and chemical stability. There are tremendous approaches for the enhancement of mechanical strength and chemical stability of organic materials by combining organic materials with inorganic counterparts in nano-size to form composite materials..which would optimize the characteristics of gas sensors. In the paper, polyaniline/Indium(III) Oxide(PANi/In2O3) nanocomposite thin films was prepared on a quartz substrate by combination techniques of electrostatic self-assembly and in situ chemical oxidation polymerization at 10°C. Infrared spectrum analysis (IR) of the composite and scanning electron microscope(SEM) of nanocomposite thin films were performed. PANi/In2O3 nanocomposite thin film gas sensor was fabricated on AT-Cut quartz crystal microbalance(QCM) of Ag electrodes, and the sensitive properties of gas sensor to CH4 and CO are characterized and analyzed. The results indicate that PANi/In2O3 thin film gas sensor has good linear sensitive property to CH4 and CO, and is more sensitive to CH4, i.e., the sensitivity is 0.386Hz per ppm when the sensor is exposed to 500 ppm CH4 while only 0.16Hz per ppm to the same concentration of CO. Such sensitive properties of gas sensor in the constant concentration of CH4 at different temperature are also characterized. The result shows that temperature would affect the sensitive property of gas sensor.

Paper Details

Date Published: 22 May 2009
PDF: 7 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72823C (22 May 2009); doi: 10.1117/12.831026
Show Author Affiliations
Xiaolei Yan, Univ. of Electronic Science and Technology of China (China)
Guangzhong Xie, Univ. of Electronic Science and Technology of China (China)
Xiaosong Du, Univ. of Electronic Science and Technology of China (China)
Huiling Tai, Univ. of Electronic Science and Technology of China (China)
Yadong Jiang, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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