Share Email Print
cover

Proceedings Paper

Research on antireflection characteristic of rectangular subwavelength surface-relief structure
Author(s): Weimin Tan; Chun-hua Lu; Zhongzi Xu; Yaru Ni
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, using effective-medium theory (EMT) and finite different time domain (FDTD), the dependence of reflectivity to 1.06 μm incident light upon structural parameters of rectangular subwavelength surface-relief structure has been discussed, the reliability of FDTD has been proved, and the validity of the two theories has been contrasted. The influence of refractive index and filled factor to reflectivity has been analyzed detailedly. And the structural parameters also have been discussed by diffraction orders in the energy field of reflective area with FDTD. The results shows that the best filled factor is near 0.7, the structure periods should less than 0.6λ, and the structure thickness would be set to λ/4neff. It can be used as the basis for design and fabrication of surface structural materials with proper antireflection property.

Paper Details

Date Published: 21 May 2009
PDF: 7 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72822M (21 May 2009); doi: 10.1117/12.830992
Show Author Affiliations
Weimin Tan, Nanjing Univ. of Technology (China)
Chun-hua Lu, Nanjing Univ. of Technology (China)
Zhongzi Xu, Nanjing Univ. of Technology (China)
Yaru Ni, Nanjing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; John M. Schoen; Yoshiharu Namba; Shengyi Li, Editor(s)

© SPIE. Terms of Use
Back to Top