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Proceedings Paper

Research on wheel error compensation of aspheric grinding machining
Author(s): Liangyu He; Yinbiao Guo; Hao Huang; Zhenzhong Wang; Jian Wang
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Paper Abstract

This paper presents a compensation system based on wheel online dressing and online measuring. Because of its excellent dressing performance, the Green-Carbon wheel Dresser was chosen to dress the diamond wheel. And a measurement system was put forward, which included the method of diamond wheel arc detecting with displacement sensor, radius filtering, and the least-squares curve fitting. Considering the radius calculated, the compensation controlling points can be obtained. Compared with the traditional error compensation technology, advantages of this system include four aspects: no new error is brought due to the complete online operation; introducing a GC wheel dresser with tilting structure and lagging-dress method can enhance the dressing accuracy; the operation is convenient, because there is no need to make strict equal-angle measurement and to confirm zero setting; processing data through radius constraining and filtering can reach a high fitting precision, which is useful to the compensation machining later. Keywords: online dressing, online measuring, filtering, least squares method

Paper Details

Date Published: 22 May 2009
PDF: 8 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 728225 (22 May 2009); doi: 10.1117/12.830899
Show Author Affiliations
Liangyu He, Xiamen Univ. (China)
Chengdu Fine Optical Engineering Research Ctr. (China)
Yinbiao Guo, Xiamen Univ. (China)
Hao Huang, Chengdu Fine Optical Engineering Research Ctr. (China)
Zhenzhong Wang, Xiamen Univ. (China)
Jian Wang, Xiamen Univ. (China)
Chengdu Fine Optical Engineering Research Ctr. (China)


Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; John M. Schoen; Yoshiharu Namba; Shengyi Li, Editor(s)

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