Share Email Print
cover

Proceedings Paper

Optical system of large relative aperture and wide field using aspheric corrector for detecting
Author(s): Ming Ming; Jianli Wang; Jingxu Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The magnitude requirement of space target detecting determines that the image of detecting telescope should have several performances: small spots, small 80% encircled energy diameter and good MTF(Modulation transfer function). So the aperture and field of view of optical system have some demands accordingly. The larger aperture, the more energy that telescope collects and higher magnitude the telescope detects; the wider field of view, the more extensive range which the telescope searches. Now most of ground telescopes whose apertures are from 500mm to 1000mm is on-axis optical system, so wide field of view becomes the most importance problem. To obtain large relative aperture and wide field of view, the paper introduces a catadioptric telescope with small aperture aspheric refractive corrector, whose conic surface will be used to remove the aberrations due to large relative aperture and wide field of view. As to the optical system, there is only one aspheric refractive corrector, and it is relatively easy for manufacturing because of its concave figure and normal material. The paper gives the example, and optimizes this optical system with ZEMAX program. And then the paper provides a specific analysis program for testing the aspheric refractive corrector. The aperture of this optical system is 750mm, and its relative aperture is 0.82, and the field of view is 3.6° diameter(diagonal). Its structure is simple and the image quality is also very good.

Paper Details

Date Published: 22 May 2009
PDF: 5 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 728222 (22 May 2009); doi: 10.1117/12.830896
Show Author Affiliations
Ming Ming, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jianli Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jingxu Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; John M. Schoen; Yoshiharu Namba; Shengyi Li, Editor(s)

© SPIE. Terms of Use
Back to Top