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Proceedings Paper

Transfer matrix method and dispersive formula of light in thin films
Author(s): Hong-xia Dai; Qi-neng Liu
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Paper Abstract

Using boundary conditions of electromagnetic waves , a new transfer matrix method that study electromagnetic waves in thin films and a dispersive formula of 1D photonic crystal are derived. Using the formula reflection and refraction of light is studied, the forbidden band of 1D photonic crystal is studied. The transfer matrix method and the classic characteristic matrix method are compared. The transfer matrix method can not only solve the problem that characteristic matrix method can solve, the transfer matrix method can also solve the problem that characteristic matrix method can not solve. Therefore the transfer matrix method is a more fundamental and wider range of application.

Paper Details

Date Published: 21 May 2009
PDF: 6 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72820M (21 May 2009); doi: 10.1117/12.830804
Show Author Affiliations
Hong-xia Dai, Chongqing Technology and Business Univ. (China)
Qi-neng Liu, Chongqing Technology and Business Univ. (China)


Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; John M. Schoen; Yoshiharu Namba; Shengyi Li, Editor(s)

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