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Proceedings Paper

Dual-CGH interferometry test for x-ray mirror mandrels
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Paper Abstract

We describe a glancing-incidence interferometric double-pass test, based on a pair of computer-generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces.

Paper Details

Date Published: 17 June 2009
PDF: 5 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891B (17 June 2009); doi: 10.1117/12.830659
Show Author Affiliations
Guangjun Gao, National Insitute of Standards and Technology (United States)
John P. Lehan, Univ. of Maryland, Baltimore County (United States)
NASA Goddard Space Flight Ctr. (United States)
Ulf Griesmann, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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