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Proceedings Paper

Ultraviolet through infrared imager performance testing
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Paper Abstract

The objective of any imaging system is to optimize the amount of pertinent information collected from a scene. Whether it is used for artistic reproduction, scientific research, or camouflage detection, a camera has the same ultimate requirement. In the era of broadband, multi-spectral, hyperspectral, and fused sensor systems, both spectral and spatial data continue to play battling roles in determining which is dominant in how well an imaging system meets its definitive objective. Typically sensor testing requires hardware and software exclusively designed for the spectral region of interest. Thus an imaging system with ultraviolet through infrared imaging capabilities could require three or more separate test benches for sensor characterization. Obviously this not only increases the complexity, and subsequently the cost of testing, but also more importantly tends to produce discontinuous results. This paper will outline the hardware and software developed by the authors that employ identical test methods and shared optics to complete infrared, visible, and ultraviolet sensor performance analysis. Challenges encompassing multiple emitting source switching, splitting, and combining will be addressed along with new single fused type source designs. Decisions related to specifying optics and targets of sufficient quality and construction to provide coverage of the full spectral region will be discussed along with sample performance specifications and data. Test methodology controlled by a single automated software suite will be summarized including modulation transfer function, signal to noise ratio, uniformity, focus, distortion, intrascene dynamic range, and sensitivity. Selected examples of results obtained by this test set will be presented.

Paper Details

Date Published: 23 September 2009
PDF: 14 pages
Proc. SPIE 7481, Electro-Optical and Infrared Systems: Technology and Applications VI, 74810A (23 September 2009); doi: 10.1117/12.830536
Show Author Affiliations
Jason A. Mazzetta, Electro Optical Industries, Inc. (United States)
Stephen D. Scopatz, Electro Optical Industries, Inc. (United States)


Published in SPIE Proceedings Vol. 7481:
Electro-Optical and Infrared Systems: Technology and Applications VI
David A. Huckridge; Reinhard R. Ebert, Editor(s)

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