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Proceedings Paper

Determination of mixing layer heights by ceilometer and influences upon air quality at Mexico City airport
Author(s): Klaus Schäfer; Edgar Flores-Jardines; Stefan Emeis; Michel Grutter; Ralf Kurtenbach; Peter Wiesen; Christoph Münkel
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Paper Abstract

Monitoring of mixing layer height (MLH) was performed during different measurement campaigns in urban and suburban area (Hannover, Munich, Budapest, Zürich, Augsburg) by the Vaisala ceilometer LD40. It is an eye-safe commercial lidar and designed originally to detect cloud base heights and vertical visibility for aviation safety purposes. Software for routine retrieval of mixing layer height from ceilometer data was developed and improved continuously. MLH was determined during a one-week-campaign at the airport Mexico City. Air pollutants like NO, NOx, CO and O3 as well as meteorological parameters like wind, temperature and irradiance are measured at the airport in addition to the air quality monitoring network RAMA in Mexico City. The influence of MLH together with wind, temperature and cloudiness upon air pollution is investigated. These continuous MLH and meteorological data are correlated with simultaneous measured air pollutants. The influence of mixing layer height upon air quality is shown.

Paper Details

Date Published: 25 September 2009
PDF: 11 pages
Proc. SPIE 7475, Remote Sensing of Clouds and the Atmosphere XIV, 74750M (25 September 2009); doi: 10.1117/12.830425
Show Author Affiliations
Klaus Schäfer, Forschungszentrum Karlsruhe GmbH (Germany)
Edgar Flores-Jardines, Forschungszentrum Karlsruhe GmbH (Germany)
Stefan Emeis, Forschungszentrum Karlsruhe GmbH (Germany)
Michel Grutter, Univ. Nacional Autónoma de México (Mexico)
Ralf Kurtenbach, Bergische Univ. Wuppertal (Germany)
Peter Wiesen, Bergische Univ. Wuppertal (Germany)
Christoph Münkel, Vaisala GmbH (Germany)


Published in SPIE Proceedings Vol. 7475:
Remote Sensing of Clouds and the Atmosphere XIV
Richard H. Picard; Klaus Schäfer; Adolfo Comeron; Evgueni I. Kassianov; Christopher J. Mertens, Editor(s)

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