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Proceedings Paper

Generic materials property data storage and retrieval for the semiconducting materials knowledge base
Author(s): Dumont M. Jones; Kim F. Ferris; Bobbie-Jo M. Webb-Robertson; Joan T. Muellerleile; Roger W. Hyatt
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Paper Abstract

Informatics-based identification of candidate semiconducting radiation detection materials depends upon the development of a robust knowledge base of materials properties. However, the accuracy and integrity of the knowledge base are often affected by information loss due to incomplete entry and loss of context. We describe our methods for materials property data storage and retrieval, in support of semiconductor development for gamma radiation detection materials informatics applications. Analysis-ready data representations vary with each materials design problem, and are often inconsistent with accurate generic property storage. The proposed approach provides simple, strongly-typed generic storage for as-measured properties, with tools for assessing as-measured properties and converting them to analysis-ready representations. This process simplifies property data stewardship, and allows fine control over the assumptions of data fusion, system characterization, and property representation employed in property-estimation models.

Paper Details

Date Published: 11 September 2009
PDF: 10 pages
Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491R (11 September 2009); doi: 10.1117/12.830146
Show Author Affiliations
Dumont M. Jones, Proximate Technologies, LLC (United States)
Kim F. Ferris, Pacific Northwest National Lab. (United States)
Bobbie-Jo M. Webb-Robertson, Pacific Northwest National Lab. (United States)
Joan T. Muellerleile, Proximate Technologies, LLC (United States)
Roger W. Hyatt, Battelle Memorial Institute (United States)

Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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