Share Email Print
cover

Proceedings Paper

CdTe and CdZnTe semiconductor detector arrays for fast spectroscopic x-ray imaging
Author(s): A. Brambilla; P. Ouvrier-Buffet; G. Gonon; J. Rinkel; L. Verger; C. Boudou
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Recently, there is a growing interest for high flux X-ray imaging detectors with energy discrimination or spectroscopy capabilities. In this study we evaluate the performances of energy sensitive CdTe and CdZnTe detectors for X-ray imaging at fluxes up to 2 107 X.mm-2.s-1 in the 20-150 keV energy range. The linear array detectors made from 3 mm thick single CdTe or CdZnTe crystals have 16 pixels with a 800 μm pitch. They were coupled to an innovative custom designed 16 channels fast spectroscopy front-end electronic. A FPGA controls the acquisition and reconstructs the energy spectra on 256 bins for each channel. The detector was tested under X-rays for fluxes in the 105 to 2 107 X.mm-2.s-1 range. The main problem encountered at such high fluxes is the multiplication of pile-up events that reduces the count-rate and degrades the energy resolution. With the use of a very short shaping time, the dead time was lower than 50 ns and an energy resolution of 10 keV full width at half maximum (FWHM) at 2 106 X.mm-2.s-1 and 20 keV (FWHM) at 107 X.mm-2.s-1 were achieved.

Paper Details

Date Published:
PDF: 9 pages
Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74490K; doi: 10.1117/12.830059
Show Author Affiliations
A. Brambilla, CEA-LETI, MINATEC (France)
P. Ouvrier-Buffet, CEA-LETI, MINATEC (France)
G. Gonon, CEA-LETI, MINATEC (France)
J. Rinkel, CEA-LETI, MINATEC (France)
L. Verger, CEA-LETI, MINATEC (France)
C. Boudou, Thales Electron Devices (France)


Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

© SPIE. Terms of Use
Back to Top