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Proceedings Paper

DQE of imaging detectors for application in crystallography
Author(s): Hans Roehrig; William V. Schempp; Michael A. Damento; Alonzo Pickett; Wayne Maher; Hugh Garvey
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Paper Abstract

We have evaluated for the first time the Detective Quantum Efficiency of 2 imaging detectors which are used for Crystallography. Crystallography is the science of determining the arrangement of atoms within a crystal from the manner in which a beam of usually low energy (8-17.5 keV) monochromatic X-rays is scattered from the electrons within the crystal. There is a growing consensus in the scientific world that the Detective Quantum Efficiency (DQE) is the most suitable parameter for describing the imaging performance of an x-ray imaging device. The DQE describes the ability of the imaging system to preserve the Signal to Noise Ratio (SNR) on the way from the radiation field emerging from the very fine and practically monochrome x-ray beam through the various imaging system components up to the 3-dimensional crystal image. Normally the DQE of x-ray systems is based on the effective energy of the x-ray beam and the x-ray dose as measured with a dosimeter. Typical dosimeters are not very accurate at low x-ray energies which are used in Crystallography. We used an x-ray spectrometer to determine the x-ray photon fluence. Values of DQE at low spatial frequency were at about almost 80 % at 8 keV.

Paper Details

Date Published: 12 September 2009
PDF: 12 pages
Proc. SPIE 7450, Penetrating Radiation Systems and Applications X, 745008 (12 September 2009); doi: 10.1117/12.830041
Show Author Affiliations
Hans Roehrig, The Univ. of Arizona (United States)
William V. Schempp, Rigaku Innovative Technologies, Inc. (United States)
Michael A. Damento, Rigaku Innovative Technologies, Inc. (United States)
Alonzo Pickett, Rigaku Innovative Technologies, Inc. (United States)
Wayne Maher, Rigaku Innovative Technologies, Inc. (United States)
Hugh Garvey, Rigaku Innovative Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 7450:
Penetrating Radiation Systems and Applications X
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Richard C. Schirato, Editor(s)

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