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Proceedings Paper

Developing an accelerated life test method for LED drivers
Author(s): Lei Han; Nadarajah Narendran
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Paper Abstract

Although light-emitting diodes (LEDs) have the potential for long life, LED luminaires may experience a much shorter life for the system as a whole because of the driver. Past studies show that the electrolytic capacitor used in switch-mode power supplies often has the shortest lifetime, and thus determines the electronic driver lifetime. This study demonstrated an accelerated life test method for LED drivers that use electrolytic capacitors at the output stage by monitoring the output current ripple trends at different elevated operating temperatures.

Paper Details

Date Published: 18 August 2009
PDF: 8 pages
Proc. SPIE 7422, Ninth International Conference on Solid State Lighting, 742209 (18 August 2009); doi: 10.1117/12.829901
Show Author Affiliations
Lei Han, Rensselaer Polytechnic Institute (United States)
Nadarajah Narendran, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 7422:
Ninth International Conference on Solid State Lighting
Ian T. Ferguson; Christoph Hoelen; Jianzhong Jiao; Tsunemasa Taguchi, Editor(s)

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