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Proceedings Paper

Design and development of nanostructure based antireflection coatings for EO/IR sensor applications
Author(s): Ashok K. Sood; Roger E. Welser; Yash R. Puri; Martin F. Schubert; David J. Poxson; Jong Kyu Kim; E. Fred Schubert; Dennis L. Polla; Martin B. Soprano
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Paper Abstract

EO/IR Nanosensors are being developed for a variety of Defense and Commercial Systems Applications. These include UV, Visible, NIR, MWIR and LWIR Nanotechnology based Sensors. The conventional SWIR Sensors use InGaAs based IR Focal Plane Array (FPA) that operate in 1.0-1.8 micron region. Similarly, MWIR Sensors use InSb or HgCdTe based FPA that is sensitive in 3-5 micron region. More recently, there is effort underway to evaluate low cost SiGe visible and near infrared band that covers performance up to 1.6 micron. The use of Nanowires for developing high quality antireflection coatings that allows minimizing the reflection loss is discussed. We have explored the possibility of using nanostructures grown by oblique angle deposition technique. A graded-index coating with different index profiles has been investigated for broadband antireflection properties, particularly with air as the ambient medium. In this paper, we present, modeling and experimental results for nanostructure AR coatings for UV, Visible and calculations for NIR sensors and also their utility for longer wavelength application.

Paper Details

Date Published: 4 September 2009
PDF: 8 pages
Proc. SPIE 7419, Infrared Systems and Photoelectronic Technology IV, 74190U (4 September 2009); doi: 10.1117/12.829899
Show Author Affiliations
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Yash R. Puri, Magnolia Optical Technologies, Inc. (United States)
Martin F. Schubert, Rensselaer Polytechnic Institute (United States)
David J. Poxson, Rensselaer Polytechnic Institute (United States)
Jong Kyu Kim, Rensselaer Polytechnic Institute (United States)
E. Fred Schubert, Rensselaer Polytechnic Institute (United States)
Dennis L. Polla, Defense Advanced Research Projects Agency (United States)
Martin B. Soprano, U.S. Army (United States)

Published in SPIE Proceedings Vol. 7419:
Infrared Systems and Photoelectronic Technology IV
Eustace L. Dereniak; Randolph E. Longshore; Ashok K. Sood; John P. Hartke; Paul D. LeVan, Editor(s)

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