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Proceedings Paper

Development and performance characteristics of III-VI chalcogenide layered semiconductors for radiation detectors
Author(s): Krishna C. Mandal; Alket Mertiri; Gary W. Pabst; Ronald G. Roy; Michael Choi; Sung Hoon Kang; P. Bhattacharya; Yunlong Cui; Michael Groza; Arnold Burger; Adam M. Conway; B. W. Sturm; Rebecca J. Nikolic; Art J. Nelson; Stephen A. Payne
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Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 744915; doi: 10.1117/12.829610
Show Author Affiliations
Krishna C. Mandal, EIC Labs., Inc. (United States)
Alket Mertiri, EIC Labs., Inc. (United States)
Gary W. Pabst, EIC Labs., Inc. (United States)
Ronald G. Roy, EIC Labs., Inc. (United States)
Michael Choi, EIC Labs., Inc. (United States)
Sung Hoon Kang, EIC Labs., Inc. (United States)
P. Bhattacharya, Fisk Univ. (United States)
Yunlong Cui, Fisk Univ. (United States)
Michael Groza, Fisk Univ. (United States)
Arnold Burger, Fisk Univ. (United States)
Adam M. Conway, Lawrence Livermore National Lab. (United States)
B. W. Sturm, Lawrence Livermore National Lab. (United States)
Rebecca J. Nikolic, Lawrence Livermore National Lab. (United States)
Art J. Nelson, Lawrence Livermore National Lab. (United States)
Stephen A. Payne, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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