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Proceedings Paper

Innovative microchannel plate with reformulation of composition and modification of microstructure
Author(s): Jingsheng Pan; Jingwen Lv; S. A. Kesaev; Shulin Liu; Zhanying Liu; Junguo Li; Xiaoqin Chong; Detan Shu
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Paper Abstract

The signal-to-noise ratio (SNR) and mean time to failure (MTTF) are two important attributes to describe the performance and operation life of an image intensifier. The presents of the ion barrier film (IBF) in Gen. III image intensifier, which used to suppress MCP's ion feedback, while dramatically improve the MTTF but significantly reduce the SNR, so more completely diminishing the ion poisoning source within the channels of MCP are crucial for improved Gen. III; image intensifier to thinned thickness IBF and achieving this two conflicting attributes promotion simultaneously. This research was originally initiated to develop a MCP with glass composition redesigned specially for GaAs photocathode image intensifier, proved which can be imposed an exceedingly intensive electron bombard degassing but without suffering a fatal gain degrade, and had achieved significantly improved SNR of Gen. III image intensifier but with a short distance to meet the lifetime success, so that our research work step forward to intent upon the restriction of ion poisoning source formation within the MCP substrate, we reformulated the MCP glass composition, and modified the microstructure of this MCP glass substrate though a glass-crystal phase transition during the MCP fabricate heating process, we present an innovative MCP based on a glass-ceramic substrate, with reformulated composition and close-linked network microstructure mix with many of nanometer size crystal grains, provide this MCP with sustainable high gain, lower ion feedback and less outgasing performance, this glass-ceramic MCPs are assembled to Gen. III image intensifiers which results showing promoting both the MTTF and SNR of Gen. III image intensifier.

Paper Details

Date Published: 6 August 2009
PDF: 8 pages
Proc. SPIE 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, 738402 (6 August 2009); doi: 10.1117/12.829493
Show Author Affiliations
Jingsheng Pan, Changchun Univ. of Science and Technology (China)
North Night Vision Technology Co., Ltd. (China)
Jingwen Lv, Changchun Univ. of Science and Technology (China)
S. A. Kesaev, Katod JSC (Russian Federation)
Shulin Liu, North Night Vision Technology Co., Ltd. (China)
Zhanying Liu, Beijing Hamamatsu Photon Technology Inc. (China)
Junguo Li, North Night Vision Technology Co., Ltd. (China)
Xiaoqin Chong, North Night Vision Technology Co., Ltd. (China)
Detan Shu, North Night Vision Technology Co., Ltd. (China)


Published in SPIE Proceedings Vol. 7384:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications
Kun Zhang; Xiang-jun Wang; Guang-jun Zhang; Ke-cong Ai, Editor(s)

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