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Data processing and parameter extraction for cutting tool inspectionFormat | Member Price | Non-Member Price |
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Paper Abstract
The increase in awareness of the need to improve quality control on part machining efficiency has led to a great deal of
research aimed at cutting tool geometry analysis. This paper presents a framework of preprocessing point-based data and
extracting parameters after feature detection and data segmentation for cutting tool inspection, assuming unorganized
measurement data. The data processing method, including data decimating, smoothing, normal and curvature estimating,
denoising, sorting, as well as re-sampling, are exploited to meet the demands for high quality, data simplification for
geometric analysis. We will discuss the geometry analysis for parameter extraction, including key feature point
detection and key area segmentation based on general reverse engineering solutions and specific cutting tool
characteristics. Based on the presented simplification methods using virtual slicing and rotary axial projection data, some
cutting tool dimensional parameters can be extracted directly. Alternately, based on 2D points on a given cross section, a
plurality of curves can be generated, and optimized by minimizing deviations between the set of points and the plurality
of curves. Section parameters can then be extracted from the optimized curves. Furthermore, the methods and processes
of multi-section based spatial parameter extraction will be illustrated. This paper presents experimental results and field
tests. The experimental results show that the preprocessing is very robust and the parameter extraction results agree with
what is expected.
Paper Details
Date Published: 10 September 2009
PDF: 12 pages
Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320C (10 September 2009); doi: 10.1117/12.828890
Published in SPIE Proceedings Vol. 7432:
Optical Inspection and Metrology for Non-Optics Industries
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)
PDF: 12 pages
Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320C (10 September 2009); doi: 10.1117/12.828890
Show Author Affiliations
Published in SPIE Proceedings Vol. 7432:
Optical Inspection and Metrology for Non-Optics Industries
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)
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