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Proceedings Paper

Low noise planar external cavity laser for interferometric fiber optic sensors
Author(s): Mazin Alalusi; Paul Brasil; Sanggeon Lee; Peter Mols; Lew Stolpner; Axel Mehnert; Steve Li
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Paper Abstract

A 1550 nm DWDM planar external cavity laser (ECL) is demonstrated to provide low phase/frequency noise, narrow linewidth, and low RIN. The cavity includes a semiconductor gain chip and a planar lightwave circuit waveguide with Bragg grating, packaged in a 14-pin butterfly package. This planar ECL laser is designed to operate under vibration and in harsh environmental conditions. The laser shows linewidth ≤ 2.6 kHz, phase/frequency noise comparable with that of long cavity fiber lasers, RIN ≤ -147dB/Hz at 1kHz, and power ≥ 10mW. Performance is suitable for various high performance fiber optic sensing systems, including interferometric sensing in Oil and Gas, military/security and other applications, currently served mostly by costly and less reliable laser sources.

Paper Details

Date Published: 27 April 2009
PDF: 13 pages
Proc. SPIE 7316, Fiber Optic Sensors and Applications VI, 73160X (27 April 2009); doi: 10.1117/12.828849
Show Author Affiliations
Mazin Alalusi, Redfern Integrated Optics, Inc. (United States)
Paul Brasil, Redfern Integrated Optics, Inc. (United States)
Sanggeon Lee, Redfern Integrated Optics, Inc. (United States)
Peter Mols, Redfern Integrated Optics, Inc. (United States)
Lew Stolpner, Redfern Integrated Optics, Inc. (United States)
Axel Mehnert, Redfern Integrated Optics, Inc. (United States)
Steve Li, Redfern Integrated Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 7316:
Fiber Optic Sensors and Applications VI
Eric Udd; Henry H. Du; Anbo Wang, Editor(s)

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