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Proceedings Paper

Study on location method with testing interferometric data of circle optical components
Author(s): Wei Chen; Guang-kuan Zhou; Yan-ying Ju; Bin Fan; Yong-jian Wan
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Paper Abstract

As a rule, Interferometers are used to test the Figure in the polishing phase of optical components. It could provide advance tutor suggestion for manufacturing. Various spatial points on the testoptical components will be given by interferogram analysis. Binary image is got from raw data. The edge of optical component is differentiated with a sobel exactly. A coefficient constraint condition is incorporated into the least squares method for geometric parameters of circles.The center coordinates and size of radius will be calculated by the method, and then the coordinate of the interferogram could be erected exactly.

Paper Details

Date Published: 20 May 2009
PDF: 4 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72834K (20 May 2009); doi: 10.1117/12.828830
Show Author Affiliations
Wei Chen, Xi'an Univ. of Science and Technology (China)
Guang-kuan Zhou, Xi'an Univ. of Science and Technology (China)
Yan-ying Ju, Xi'an Univ. of Science and Technology (China)
Bin Fan, Institute of Optics and Electronics (China)
Yong-jian Wan, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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