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Proceedings Paper

Ceramic substrate's detection system based on machine vision
Author(s): Li-na Yang; Zhen-feng Zhou; Li-jun Zhu
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Paper Abstract

Machine vision detection technology is an integrated modern inspection technology including optoelectronics, computer image, information processing and computer vision etc. It regards image as means and carrier of transmitting information, and extracts useful information from image and acquires all kinds of necessary parameters by dealing with images. Combining key project in Zhejiang Province Office of Education-research of high accuracy and large size machine vision automatic detection and separation technology. The paper describes the primary factors of influencing system's precision, develops an automatic detection system of ceramic substrate. The system gathers the image of ceramic substrate by CMOS( Complementary Metal-Oxide Semiconductor). The quality of image is improved by optical imaging and lighting system. The precision of edge detection is improved by image preprocessing and sub-pixel. In image enhancement part , image filter and geometric distortion correction are used. Edges are obtained through a sub-pixel edge detection method: determining the probable position of image edge by advanced Sobel operator and then taking three-order spline interpolation function to interpolate the gray edge image. The mathematical modeling of dimensional and geometric error of visual inspection system is developed. The parameters of ceramic substrate's length, and width are acquired. The experiment results show that the presented method in this paper increases the precision of vision detection system , and measuring results of this system are satisfying.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72834I (20 May 2009); doi: 10.1117/12.828828
Show Author Affiliations
Li-na Yang, Jiaxing Univ. (China)
Zhen-feng Zhou, Jiaxing Univ. (China)
Li-jun Zhu, Jiaxing Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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