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Proceedings Paper

Study on bi-color phase measurement deflectometry
Author(s): Yuankun Liu; Xianyu Su; Qican Zhang
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Paper Abstract

Phase Measuring Deflectometry(PMD), which is aimed at testing specular free-form surfaces, has been developed in recent years. Normally, two sets of sinusoidal fringe patterns are needed, i.e. horizontal and vertical fringe patterns. So it will be time-consuming in PMD system while pursing high accuracy. Here we propose a Bi-color PMD system that will produce one frame fringe consisting of two interlaced RGB format base color fringe patterns, i.e. vertical pattern and horizontal pattern. The fringe patterns could be captured by color camera and the absolute phase will be got by phase-shift technique. It could lead to a faster measuring process and make PMD technique more useful.

Paper Details

Date Published: 20 May 2009
PDF: 4 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728349 (20 May 2009); doi: 10.1117/12.828819
Show Author Affiliations
Yuankun Liu, Sichuan Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Qican Zhang, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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