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Proceedings Paper

Approximate model for calculating radiance of atmospheric background
Author(s): Chun-Ping Yang; Xue Qing Meng; Jian Wu
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Paper Abstract

Spectral intensity of atmospheric background radiance plays an important part in effects during Earth-sensing and measuring, for example flood monitoring, resource remote sensing, earthquake forecasting, monitoring of forest fire, etc. An approximate model for calculating atmospheric radiance was developed with Radiative Transfer theory based on transmission of energy. In this model, atmospheric radiance is divided into four sections: (1) single scattering radiance process of solar radiance by atmosphere particulates; (2) multiple scattering radiance of solar radiation by atmosphere particulates; (3) infrared thermal emission of the path atmosphere; (4) reflected radiance by the Earth's surface. Computing methods are analyzed deeply, and their analytical expresses are given out, respectively. Particularly, effect of reflection of the Earth's surface on atmospheric radiance is thoroughly studied and derived. Finally, atmospheric spectral radiance was calculated for some representatively meteorologic states. The results show that atmospheric background radiance is mainly composed with scattered radiance of solar radiation by atmospheric particulates while wavelength is less than 3μm, and with infrared thermal radiance of path atmosphere and effect of the Earth's surface on atmospheric radiance may be neglectable while wavelength is more than 3 μm.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72833S (20 May 2009); doi: 10.1117/12.828790
Show Author Affiliations
Chun-Ping Yang, Univ. of Electronic Science and Technology of China (China)
Xue Qing Meng, Univ. of Electronic Science and Technology of China (China)
Jian Wu, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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